Scanning Electron Microscopy and Raman spectroscopy

Scanning Electron Microscopy and Raman spectroscopy

Scanning electron microscope (SEM) with accessories for energy dispersive X-ray spectroscopy analysis (EDS) and wavelength dispersive X-ray spectroscopy (WDS), cathodoluminescence (CL), electron diffraction (EBSD, Electron Backscatter Diffraction). Furthermore, the instrument has detectors for both secondary (SE) and backscattered backscattered electrons (BSE).

The instrument with its accessories offers excellent opportunities for detailed microchemical studies and high-resolution imaging of solid phases. The SEM has options for variable pressure, which permits the study of uncoated samples (but not quantitative chemical analyses).